Vector Network Analyzers (VNA)
MS46131A Modular 1-Port Vector Network Analyzer
The Anritsu ShockLineTM MS46131A series consists of three modular, PC-controlled 1-port vector network analyzers (VNAs) with frequency ranges from 1 MHz to 8/20/43.5 GHz. Anritsus patented nonlinear transmission line (NLTL) technology VNA-on-chip technology simplifies the internal VNA architecture, reducing the size and cost of the instrument while enhancing accuracy and measurement repeatability. The ShockLine MS46131A series is small and portable enough to bring the VNA port to the device under test (DUT), improving measurement stability and simplifying test configuration by eliminating test port cables.
Key Features
- 1-port VNA with frequency options from 1 MHz to 8 GHz / 20 GHz / 43.5 GHz
- Guaranteed performance to 43.5 GHz with Extended-KTM ports
- PC control takes advantage of external computer processing power and functionality
- Small and lightweight package enables direct connection to the DUT
- No on-board data storage eliminates the need for data purging in secure applications
- All ShockLine VNAs share common software supporting GUI and program compatibility
- Time domain with time gating option enables easier and faster fault identification
Technical Specifications
| Frequency Range | 1 MHz to 8 GHz / 20 GHz / 43.5 GHz (model dependent) |
|---|---|
| Number of Ports | 1-port |
| Port Type | Extended-K™ ports (guaranteed performance up to 43.5 GHz) |
| Architecture | NLTL (Nonlinear Transmission Line) VNA-on-chip technology |
| Control | PC-controlled via USB/LAN, leveraging external computer processing |
| Package Size and Weight | Small and lightweight, suitable for direct connection to DUT |
| Data Storage | No on-board data storage for enhanced security and no data purging |
| Software | Common ShockLine software GUI with full compatibility across models |
| Time Domain | Optional time domain with time gating for fast fault identification |
| Applications | Portable and flexible VNA measurements close to DUT, improved measurement stability, secure environments |